Wavelength-thick ENZ ITO Metafilm for Near IR Photonic Devices

被引:0
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作者
Ni, Jimmy H. [1 ]
Sarney, Wendy L. [1 ]
Leff, Asher C. [1 ]
Cahill, James P. [1 ]
Zhou, Weimin [1 ]
机构
[1] CCDC, US Army Res Lab, Sensors & Electron Devices Directorate, Electroopt & Photon Div, 2800 Powder Mill Rd, Adelphi, MD 20783 USA
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TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We are reporting wavelength-thick ITO films in ENZ regime around optical telecommunications wavelength, which permit the design of new ENZ photonic devices. Non-uniform optical behavior has been studied and presented in this paper. (C) 2020 The Author(s)
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