Wavelength-thick ENZ ITO Metafilm for Near IR Photonic Devices

被引：0

作者：

Ni, Jimmy H. ^{[1
]}

Sarney, Wendy L. ^{[1
]}

Leff, Asher C. ^{[1
]}

Cahill, James P. ^{[1
]}

Zhou, Weimin ^{[1
]}

机构：

[1] CCDC, US Army Res Lab, Sensors & Electron Devices Directorate, Electroopt & Photon Div, 2800 Powder Mill Rd, Adelphi, MD 20783 USA

来源：

2020 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO) | 2020年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We are reporting wavelength-thick ITO films in ENZ regime around optical telecommunications wavelength, which permit the design of new ENZ photonic devices. Non-uniform optical behavior has been studied and presented in this paper. (C) 2020 The Author(s)

引用

页数：2

共 10 条

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