Detection of Shadow Mask Defects Using Periodic Hole Placement

被引:0
|
作者
Woo, Dong-Min [1 ]
机构
[1] Myongji Univ, Dept Informat Engn, Image Proc Lab, Gyeonggido 449728, South Korea
关键词
D O I
10.1109/ICECT.2009.122
中图分类号
TP39 [计算机的应用];
学科分类号
081203 ; 0835 ;
摘要
This paper presents an efficient image analysis methodology which can detect the very small hole defects reliably and rapidly from shadow mask. In fact, shadow, mask title image data can be adjusted to be periodical with the period of an integer number The inspection method mainly depends on the fact that a small defect can be significantly emphasized in terms of the comparison between image pixels departed by, the period. In this paper, this comparison is implemented as FIR digital filtering algorithm, which can be rapidly processed by DSP chip. In terms of high speed title image sensing and fast algorithm by DSP the whole inspection scheme sufficiently supports real time, shadow mask handing. From the experimental results, this scheme shows it reliable inspection capability for all types of individual hole defects.
引用
收藏
页码:371 / +
页数:2
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