Analysis of Dielectric Properties in High-Voltage Insulator by Dielectric Spectroscopy (DRS)

The aim of this article is to investigate the dielectric properties of high-voltage insulator. Dielectric relaxation spectroscopy (DRS) was chosen as a method for this purpose and used on the plastic support insulator. Two measuring devices with different frequency range and different voltage range were used in this experiment, The first apparatus was with a frequency range from 0.1 mHz to 10 kHz, in depend on voltage value from 1V to 160 V. The other device had a frequency range from 10 Hz to 2 MHz at a constant voltage of 2 V. We used these two devices to obtain a description of polarization processes in a broad spectrum from 0.1 mHz to 2 MHz at the voltage 2V. During the second experiment, a value of the voltage was increased only in one of the devices to explore polarization processes at increased voltage. This device can measure the surface resistance of the insulator, which has been also reviewed in this publication. Both, serial and parallel RC model were used for measurement in devices in order to compare the results of measurement.