Set-up for dynamic testing of ADCs using the histogram method

被引：0

作者：

Brás, V ^{[1
]}

Ramos, HMG ^{[1
]}

机构：

[1] Univ Tecn Lisboa, Inst Super Tecn, Inst Telecomunicacoes, DEEC, P-1096001 Lisbon, Portugal

来源：

ICEMI'2001: FIFTH INTERNATIONAL CONFERENCE ON ELECTRONIC MEASUREMENT AND INSTRUMENTS, VOL 1, CONFERENCE PROCEEDINGS | 2001年

关键词：

D O I：

暂无

中图分类号：

TP18 [人工智能理论];

学科分类号：

081104 ; 0812 ; 0835 ; 1405 ;

摘要：

This paper presents a dedicated bench board to test with advantage analog to digital converters (ADC) using the code density histogram method. Besides, it allows the easy testing of a stand-alone ADC with any other method. The basic idea of the new bench board is to connect the output of the ADC under test to a digital signal processor (DSP) programmed to compute the histogram as a function of the output codes. Thus, the quantity of data to be interfaced to the computer is dramatically reduced to the number of code bins of the converter. The paper fully describes the set-up and discusses the performance improvements when testing a 8-bit converter using the histogram and the FFT methods.

引用

页码：16 / 20

页数：5

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