Corrosion mechanisms at electronic assemblies under climatic stresses

被引:0
|
作者
Wege, S [1 ]
机构
[1] Tech Univ Munich, Lehrstuhl Werkstoffe Maschinenbau, D-85748 Garching, Germany
来源
关键词
D O I
10.1002/(SICI)1521-4176(200001)51:1<7::AID-MACO7>3.0.CO;2-R
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
During the industrial applications electronic assemblies are exposed to extreme stresses. A high humidity in combination with contaminations can initiate corrosion mechanisms, which cause a failure of the electronic assemblies. Main components of the contaminations are flux residues after soldering proceses. During a moisture condensation of contaminated boards electrolytic mechanisms occur, which lead to a metal dissolution and to a formation of migration bridges between solder joints and conductors. The failure-rate is a function of the composition and the concentration of the:contaminations, The use of protective coatings cannot prevent the:failure of electronic assemblied during moisture condensation, because the coatings are waterpermeable. The adsorption of water leads to the formation of bubbles and delaminations of the coating.
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页码:7 / 12
页数:6
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