Characterization of the surface charge distribution on kaolinite particles using high resolution atomic force microscopy

被引:62
|
作者
Kumar, Naveen
Zhao, Cunlu
Klaassen, Aram
van den Ende, Dirk
Mugele, Frieder
Siretanu, Igor [1 ]
机构
[1] Univ Twente, Phys Complex Fluids Grp, POB 217, NL-7500 AE Enschede, Netherlands
关键词
SAMPLE INTERACTION FORCES; ACID-BASE PROPERTIES; OIL-RECOVERY; FREE-ENERGY; ELECTROKINETIC PROPERTIES; ELECTROLYTE-SOLUTIONS; ORGANIC-ACIDS; MICA SURFACES; DOUBLE-LAYER; DISSOLUTION;
D O I
10.1016/j.gca.2015.12.003
中图分类号
P3 [地球物理学]; P59 [地球化学];
学科分类号
0708 ; 070902 ;
摘要
Most solid surfaces, in particular clay minerals and rock surfaces, acquire a surface charge upon exposure to an aqueous environment due to adsorption and/or desorption of ionic species. Macroscopic techniques such as titration and electrokinetic measurements are commonly used to determine the surface charge and zeta-potential of these surfaces. However, because of the macroscopic averaging character these techniques cannot do justice to the role of local heterogeneities on the surfaces. In this work, we use dynamic atomic force microscopy (AFM) to determine the distribution of surface charge on the two (gibbsite-like and silica-like) basal planes of kaolinite nanoparticles immersed in aqueous electrolyte with a lateral resolution of approximately 30 nm. The surface charge density is extracted from force-distance curves using DLVO theory in combination with surface complexation modeling. While the gibbsite-like and the silica-like facet display on average positive and negative surface charge values as expected, our measurements reveal lateral variations of more than a factor of two on seemingly atomically smooth terraces, even if high resolution AFM images clearly reveal the atomic lattice on the surface. These results suggest that simple surface complexation models of clays that attribute a unique surface chemistry and hence homogeneous surface charge densities to basal planes may miss important aspects of real clay surfaces.
引用
收藏
页码:100 / 112
页数:13
相关论文
共 50 条
  • [1] Probing the Surface Charge on the Basal Planes of Kaolinite Particles with High-Resolution Atomic Force Microscopy
    Kumar, N.
    Andersson, M. P.
    van den Ende, D.
    Mugele, F.
    Siretanu, I.
    [J]. LANGMUIR, 2017, 33 (50) : 14226 - 14237
  • [2] Surface force measurements at kaolinite edge surfaces using atomic force microscopy
    Liu, Jing
    Sandaklie-Nikolova, Linda
    Wang, Xuming
    Miller, Jan D.
    [J]. JOURNAL OF COLLOID AND INTERFACE SCIENCE, 2014, 420 : 35 - 40
  • [3] Surface force between particles studied using atomic force microscopy
    Xing, Yaowen
    Liu, Min
    Gui, Xiahui
    Cao, Yijun
    Gao, Zhiyong
    Sun, Wei
    [J]. Zhongguo Kuangye Daxue Xuebao/Journal of China University of Mining and Technology, 2019, 48 (06): : 1352 - 1357
  • [4] Wettability of kaolinite basal planes based on surface force measurements using atomic force microscopy
    Yin, X.
    Miller, J. D.
    [J]. MINERALS & METALLURGICAL PROCESSING, 2012, 29 (01) : 13 - 19
  • [5] Wettability of kaolinite basal planes based on surface force measurements using atomic force microscopy
    X. Yin
    J. D. Miller
    [J]. Mining, Metallurgy & Exploration, 2012, 29 : 13 - 19
  • [6] High resolution imaging for charged particles using CR-39 and atomic force microscopy
    Takahashi, H
    Amemiya, K
    Kaizuka, Y
    Nakazawa, M
    Yasuda, N
    Yamamoto, M
    Sakai, T
    Kamiya, T
    Okada, S
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1999, 422 (1-3): : 751 - 755
  • [7] Using the dissipation mode in high resolution atomic force microscopy
    Temiryazev A.G.
    Kraev A.V.
    Saunin S.A.
    [J]. Temiryazev, A.G., 1600, Izdatel'stvo Nauka (08): : 926 - 931
  • [8] ATOMIC RESOLUTION ON THE AGBR(001) SURFACE BY ATOMIC FORCE MICROSCOPY
    MEYER, E
    GUNTHERODT, HJ
    HAEFKE, H
    GERTH, G
    KROHN, M
    [J]. EUROPHYSICS LETTERS, 1991, 15 (03): : 319 - 323
  • [9] ATOMIC RESOLUTION ON THE SURFACE OF LIF(100) BY ATOMIC FORCE MICROSCOPY
    MEYER, E
    HEINZELMANN, H
    BRODBECK, D
    OVERNEY, G
    OVERNEY, R
    HOWALD, L
    HUG, H
    JUNG, T
    HIDBER, HR
    GUNTHERODT, HJ
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (02): : 1329 - 1332
  • [10] Interaction forces between coal and kaolinite particles measured by atomic force microscopy
    Gui, Xiahui
    Xing, Yaowen
    Rong, Guoqiang
    Cao, Yijun
    Liu, Jiongtian
    [J]. POWDER TECHNOLOGY, 2016, 301 : 349 - 355