Enhanced resolution electric force microscopy with single-wall carbon nanotube tips

被引：16
|
作者：
Wilson, NR [1 ]
Macpherson, JV
机构：
[1] Univ Warwick, Dept Phys, Coventry CV4 7AL, W Midlands, England
[2] Univ Warwick, Dept Chem, Coventry CV4 7AL, W Midlands, England
来源：
JOURNAL OF APPLIED PHYSICS | 2004年 / 96卷 / 06期
基金：
英国工程与自然科学研究理事会;
关键词：
D O I：
10.1063/1.1781759
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Electric force microscopy (EFM) is widely used for studying small-scale electrical structures. Its applicability is limited by its spatial resolution and the difficulty of deconvoluting tip effects from the image. We demonstrate that the use of single-wall carbon nanotube (SWNT) tips increases EFM spatial resolution, allowing similar features to be distinguished with separations as small as 15 nm. In addition, we show that the EFM response of the SWNT tips is consistent with a uniform-line-charge model. (C) 2004 American Institute of Physics.
引用
收藏
页码：3565 / 3567
页数：3
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