Virtual instrumentation in LabVIEW for multiple optical characterizations on the same opto-mechanical system

被引：14
|
作者：
Luna-Moreno, D. [1 ]
Espinosa Sanchez, Y. M. [1 ]
Ponce de Leon, Y. R. [1 ]
Noe Arias, E. [1 ]
Garnica Campos, G. [1 ]
机构：
[1] Ctr Invest Opt AC, Leon, Gto, Mexico
来源：
OPTIK | 2015年 / 126卷 / 19期
关键词：
LabVIEW; Surface plasmon resonance; Thin films; Refractive index sensors; REFRACTIVE-INDEX; THIN-FILM; CONSTANTS; SENSOR;
D O I：
10.1016/j.ijleo.2015.05.040
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
In this work we propose a virtual instrumentation, user-friendly, computer-controlled instrumentation and data analysis techniques, allowing an instantaneous comparison between theoretical predictions, simulations and actual experimental results. These applications in LabVIEW programming software show a virtual explosion in data acquisition and control system from the laboratory. We consider a versatile opto-mechanical system theta-2 theta by using the p-polarized light from a He Ne laser in which the surface plasmon resonance, Brewster and Brewster-Abeles methods, and scattering measurements are driven by LabVIEW software that produces fast, simple and accurate measurements of samples. The application can be used for both education and specific research purposes. (C) 2015 Elsevier GmbH. All rights reserved.
引用
收藏
页码：1923 / 1929
页数：7
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