Lossless layout image compression algorithms for electron-beam direct-write lithography

被引:4
|
作者
Chaudhary, Narendra [1 ]
Luo, Yao [1 ]
Savari, Serap A. [1 ]
McCay, Roger [2 ]
机构
[1] Texas A&M Univ, Dept Elect & Comp Engn, College Stn, TX 77843 USA
[2] GenISys Inc, San Francisco, CA 94141 USA
来源
基金
美国国家科学基金会;
关键词
Compendex;
D O I
10.1116/1.4927639
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Electron-beam direct-write lithography systems must in the future transmit terabits of information per second to be viable for commercial semiconductor manufacturing. Lossless layout image compression algorithms with high decoding throughputs and modest decoding resources are tools to address the data transfer portion of the throughput problem. The earlier lossless layout image compression algorithm Corner2 is designed for binary layout images on raster-scanning systems. The authors propose variations of Corner2 collectively called Corner2-EPC and Paeth-EPC which apply to electron-beam proximity corrected layout images and offer interesting trade-offs between compression ratios and decoding speeds. Most of our algorithms achieve better overall compression performance than portable network graphics, Block C4, and LineDiffEntropy while having low decoding times and resources. (C) 2015 American Vacuum Society.
引用
收藏
页数:9
相关论文
共 50 条
  • [1] A Lossless Circuit Layout Image Compression Algorithm for Electron Beam Direct Write Lithography Systems
    Yang, Jeehong
    Savari, Serap A.
    [J]. ALTERNATIVE LITHOGRAPHIC TECHNOLOGIES III, 2011, 7970
  • [2] Nanoring formation by direct-write inorganic electron-beam lithography
    Jiang, N
    Hembree, GG
    Spence, JCH
    Qiu, J
    de Abajo, FJG
    Silcox, J
    [J]. APPLIED PHYSICS LETTERS, 2003, 83 (03) : 551 - 553
  • [3] Lossless Compression Algorithm for REBL Direct-Write E-Beam Lithography System
    Cramer, George
    Liu, Hsin-I
    Zakhor, Avideh
    [J]. ALTERNATIVE LITHOGRAPHIC TECHNOLOGIES II, 2010, 7637
  • [4] DIRECT-WRITE ELECTRON-BEAM SYSTEM
    PETRIC, P
    WOODARD, O
    [J]. SOLID STATE TECHNOLOGY, 1983, 26 (09) : 154 - 160
  • [5] Lossless circuit layout image compression algorithm for maskless direct write lithography systems
    Yang, Jeehong
    Savari, Serap A.
    [J]. JOURNAL OF MICRO-NANOLITHOGRAPHY MEMS AND MOEMS, 2011, 10 (04):
  • [6] MEASURING AND MODELING THE PROXIMITY EFFECT IN DIRECT-WRITE ELECTRON-BEAM LITHOGRAPHY KINOFORMS
    NIKOLAJEFF, F
    BENGTSSON, J
    LARSSON, M
    EKBERG, M
    HARD, S
    [J]. APPLIED OPTICS, 1995, 34 (05): : 897 - 903
  • [7] Application of direct-write electron-beam lithography for deep-submicron fabrication
    Shy, SL
    Yew, JY
    Nakamura, K
    Chang, CY
    [J]. 16TH ANNUAL SYMPOSIUM ON PHOTOMASK TECHNOLOGY AND MANAGEMENT, 1996, 2884 : 334 - 343
  • [8] Use of positive and negative chemically amplified resists in electron-beam direct-write lithography
    Tritchkov, A
    Jonckheere, R
    VandenHove, L
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1995, 13 (06): : 2986 - 2993
  • [9] Direct-Write Ion Beam Lithography
    Joshi-Imre, Alexandra
    Bauerdick, Sven
    [J]. JOURNAL OF NANOTECHNOLOGY, 2014, 2014
  • [10] APPLICATION AND EVALUATION OF DIRECT-WRITE ELECTRON-BEAM FOR ASICS
    FUJITA, M
    SHIOZAWA, K
    KASE, T
    HAYAKAWA, H
    MIZUNO, F
    HARUTA, R
    MURAI, F
    OKAZAKI, S
    [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1988, 23 (02) : 514 - 519