Probabilistic Design for Reliability in Electronics and Photonics: Role, Significance, Attributes, Challenges

被引：0
|
作者：
Suhir, Ephraim [1 ,2 ]
机构：
[1] Portland State Univ, Portland, OR 97207 USA
[2] ERS Co, Los Altos, CA USA
来源：
2022 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS) | 2022年
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D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
TuT17
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页数：1
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