Analysis of Grain Shape and Orientation in BaFe12O19-Ferrites Using Electron Backscatter Diffraction (EBSD)

被引：4
|
作者：
Koblischka-Veneva, A. [1 ]
Koblischka, M. R. [2 ]
Chen, Y. [3 ,4 ]
Harris, V. G. [3 ,4 ]
机构：
[1] Univ Saarland, Inst Funct Mat, D-66041 Saarbrucken, Germany
[2] Univ Saarland, Inst Expt Phys, D-66041 Saarbrucken, Germany
[3] Northeastern Univ, Dept Elect & Comp Engn, Boston, MA 02115 USA
[4] Northeastern Univ, Ctr Microwave Magnet Mat & Integrated Circuits, Boston, MA 02115 USA
来源：
IEEE TRANSACTIONS ON MAGNETICS | 2009年 / 45卷 / 10期
关键词：
Crystal growth; electron microscopy; electron backscatter diffraction; ferrite; position measurement; CRYSTALLOGRAPHIC ORIENTATION; BULK;
D O I：
10.1109/TMAG.2009.2022020
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The electron backscatter diffraction (EBSD) technique enables an advanced analysis of anisotropic materials like ferrites. Here, the spatially highly resolved EBSD mappings provide additional information as compared to the standard analysis techniques, which can contribute to an optimization of the growth process. Furthermore, an analysis of the grain aspect ratio is possible which provides further insight to the microstructural dependence of the magnetic properties of ferrites.
引用
收藏
页码：4219 / 4222
页数：4
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