The Young-Feynman controlled double-slit electron interference experiment

被引：15

作者：

Tavabi, Amir H. ^{[1
,2
]}

Boothroyd, Chris B. ^{[1
,2
,3
]}

Yucelen, Emrah ^{[4
]}

Frabboni, Stefano ^{[5
,6
]}

Gazzadi, Gian Carlo ^{[6
]}

Dunin-Borkowski, Rafal E. ^{[1
,2
]}

Pozzi, Giulio ^{[1
,2
,7
]}

机构：

[1] Forschungzentrum Julich, Ernst Ruska Ctr Microscopy & Spect Electron, D-52425 Julich, Germany

[2] Forschungzentrum Julich, Peter Grunberg Inst, D-52425 Julich, Germany

[3] Nanyang Technol Univ, Sch Mat Sci & Engn, 50 Nanyang Ave, Singapore 639798, Singapore

[4] Thermo Fisher Sci, Achtseweg Noord 5, NL-5600 KA Eindhoven, Netherlands

[5] Univ Modena & Reggio Emilia, Dept FIM, Via G Campi 213-A, I-41125 Modena, Italy

[6] CNR, Inst Nanosci S3, Via G Campi 213-A, I-41125 Modena, Italy

[7] Univ Bologna, Dept Phys & Astron, Viale B Pichat 6-2, I-40127 Bologna, Italy

来源：

SCIENTIFIC REPORTS | 2019年 / 9卷 / 1期

关键词：

DIFFRACTION; BUILDUP;

D O I：

10.1038/s41598-019-43323-2

中图分类号：

O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

The key features of quantum mechanics are vividly illustrated by the Young-Feynman two-slit thought experiment, whose second part discusses the recording of an electron distribution with one of the two slits partially or totally closed by an aperture. Here, we realize the original Feynman proposal in a modern electron microscope equipped with a high brightness gun and two biprisms, with one of the biprisms used as a mask. By exciting the microscope lenses to conjugate the biprism plane with the slit plane, observations are carried out in the Fraunhofer plane with nearly ideal control of the covering of one of the slits. A second, new experiment is also presented, in which interference phenomena due to partial overlap of the slits are observed in the image plane. This condition is obtained by inserting the second biprism between the two slits and the first biprism and by biasing it in order to overlap their images.

引用

页数：8

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