Two models for a repairable two-system with phase-type sojourn time distributions

被引:27
|
作者
Pérez-Ocón, R [1 ]
Castro, JER [1 ]
机构
[1] Univ Granada, Dept Estadist & Invest Operat, E-18071 Granada, Spain
关键词
Markov processes; replacement; phase-type distributions; reliability; rate of occurrence of failures;
D O I
10.1016/j.ress.2003.11.006
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This paper investigates a general repairable two-system. The operational and repair times are general, but for applicability, are approached by phase-time distributions, given that this class is dense in the set of distribution functions on the positive real line. Two models are studied, depending on the remembering of the failure phase when the unit is repaired. The versatility of this class of functions is shown. For these models, the availability and the rate of occurrence of failures are calculated. These performance measures are presented in a well-structured form, and are computationally implemented. The method and results are illustrated by a numerical example. The present work generalizes others in the specialized literature, and completes the study of two-systems under the Markov system. (C) 2003 Elsevier Ltd. All rights reserved.
引用
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页码:253 / 260
页数:8
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