Influence of film formation on light-trapping properties of randomly textured silicon thin-film solar cells

被引:6
|
作者
Jovanov, Vladislav [1 ]
Shrestha, Shailesh [1 ]
Huepkes, Juergen [2 ]
Ermes, Markus [2 ]
Bittkau, Karsten [2 ]
Knipp, Dietmar [1 ]
机构
[1] Jacobs Univ Bremen, Res Ctr Funct Mat & Nanomol Sci, Elect Devices & Nanophoton Lab, D-28759 Bremen, Germany
[2] Forschungszentrum Julich, Inst Energie & Klimaforsch, Photovolta IEK 5, D-52425 Julich, Germany
关键词
INTERFACE MORPHOLOGIES; TCO;
D O I
10.7567/APEX.7.082301
中图分类号
O59 [应用物理学];
学科分类号
摘要
The influence of film formation on light-trapping properties of silicon thin-film solar cells prepared on randomly textured substrates was studied. Realistic interface morphologies were calculated with a three-dimensional (3D) surface coverage algorithm using the measured substrate morphology and nominal film thicknesses of the individual layers as input parameters. Calculated interface morphologies were used in finite-difference time-domain simulations to determine the quantum efficiency and absorption in the individual layers of the thin-film solar cells. The investigation shows that a realistic description of interface morphologies is required to accurately predict the light-trapping properties of randomly textured silicon thin-film solar cells. (C) 2014 The Japan Society of Applied Physics
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页数:4
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