Experience with a fluorescence-based beam position monitor at the APS

被引：0

作者：

Dufresne, EM ^{[1
]}

Guzman, JA ^{[1
]}

Dierker, SB ^{[1
]}

Clarke, R ^{[1
]}

Arms, DA ^{[1
]}

Walko, DA ^{[1
]}

机构：

[1] Univ Michigan, Dept Phys, Ann Arbor, MI 48109 USA

来源：

SYNCHROTRON RADIATION INSTRUMENTATION | 2004年 / 705卷

关键词：

D O I：

暂无

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We have recently redesigned the first crystal mount of our cryogenically cooled monochromator to reduce its sensitivity to pressure fluctuations in the cryogenic lines feeding the Si (111) crystal. With the use of a fluorescence-based X-ray beam position monitor (BPM) placed 19 m away from the monochromator, much operational experience has been gained on the sensitivity of the beam position and intensity to small changes in the cooling system. In this presentation, we will describe our X-ray BPM design and performance and will provide examples of changes that have made the beam position more stable on our bean-dine. One such change for example has been the top-up operation of the Advanced Photon Source (APS), which has reduced the thermal drifts associated with the ring current decay.

引用

页码：679 / 682

页数：4

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