Micromanipulation and Pick-Up System for X-Ray Diffraction Characterization of Micrometer-Sized Single Particles

被引：3

作者：

Takeichi, Y. ^{[1
]}

Inami, N. ^{[1
]}

Ueno, T. ^{[2
]}

Saito, K. ^{[1
]}

Otori, H. ^{[1
]}

Sagayama, R. ^{[1
]}

Kumai, R. ^{[1
]}

Ono, K. ^{[1
]}

机构：

[1] High Energy Accelerator Res Org, Inst Mat Struct Sci, Photon Factory, 1-1 Oho, Tsukuba, Ibaraki 3050801, Japan

[2] Natl Inst Mat Sci, Tsukuba, Ibaraki 3050047, Japan

来源：

1ST CONFERENCE ON LIGHT AND PARTICLE BEAMS IN MATERIALS SCIENCE 2013 (LPBMS2013) | 2014年 / 502卷

关键词：

MAGNETIC-PROPERTIES;

D O I：

10.1088/1742-6596/502/1/012008

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We describe a micromanipulation and pick-up system for preparing a micrometer-sized single particle for X-ray diffraction characterization. Combining a microgripper based on microelectromechanical systems, piezo-motor-driven linear stages, and a gamepad, the system provides precise and intuitive handling of the object. Single-crystal X-ray diffraction measurements of Sm-Fe-N permanent magnet were performed using this system. We also describe a method to distinguish crystallographically homogeneous particles found in powder-form samples.

引用

页数：4

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