SURFACE ROUGHNESS IN LANGMUIR-BLODGETT MULTILAYER FILMS STUDIED BY AFM AND X-RAY DIFFRACTION

被引：0
|
作者：
Pusztai, T. [1 ]
Rozlosnik, N.
Antal, G. [1 ,2 ]
机构：
[1] Res Inst Solid State Phys & Opt, H-1525 Budapest, Hungary
[2] Eotvos Lorand Univ, Dept Atom Phys, H-1518 Budapest, Hungary
来源：
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 1999年 / 55卷
关键词：
D O I：
暂无
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
P06.11.015
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收藏
页码：502 / 502
页数：1
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