Transistor application of alkyl-substituted picene

被引:55
|
作者
Okamoto, Hideki [1 ]
Hamao, Shino [2 ]
Goto, Hidenori [2 ]
Sakai, Yusuke [2 ]
Izumi, Masanari [2 ]
Gohda, Shin [3 ]
Kubozono, Yoshihiro [2 ,4 ]
Eguchi, Ritsuko [2 ]
机构
[1] Okayama Univ, Dept Chem, Okayama 7008530, Japan
[2] Okayama Univ, Surface Sci Res Lab, Okayama 7008530, Japan
[3] NARD Co Ltd Amagasaki, Amagasaki, Hyogo 6600805, Japan
[4] Okayama Univ, Res Ctr New Funct Mat Energy Prod Storage & Trans, Okayama 7008530, Japan
来源
SCIENTIFIC REPORTS | 2014年 / 4卷
基金
日本科学技术振兴机构;
关键词
FIELD-EFFECT TRANSISTORS; GRAPHITE RIBBONS; THIN-FILMS; PHENACENES; FAMILY; FABRICATION; MOBILITY;
D O I
10.1038/srep05048
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
Field-effect transistors (FETs) were fabricated with a thin film of 3,10-ditetradecylpicene, picene-(C14H29)(2), formed using either a thermal deposition or a deposition from solution (solution process). All FETs showed p-channel normally-off characteristics. The field-effect mobility, m, in a picene-(C14H29)(2) thin-film FET with PbZr0.52Ti0.48O3 (PZT) gate dielectric reached similar to 21 cm(2) V-1 s(-1), which is the highest mu value recorded for organic thin-film FETs; the averagem mu value (<mu >) evaluated from twelve FET devices was 14(4) cm(2)V(-1) s(-1). The, m. values for picene-(C14H29)(2) thin- film FETs with other gate dielectrics such as SiO2, Ta2O5, ZrO2 and HfO2 were greater than 5 cm(2) V-1 s(-1), and the lowest absolute threshold voltage, vertical bar V-th vertical bar, (5.2 V) was recorded with a PZT gate dielectric; the average jVthj for PZT gate dielectric is 7(1) V. The solution-processed picene-(C14H29)(2) FET was also fabricated with an SiO2 gate dielectric, yielding mu = 3.4 x 10(-2) cm(2) V-1 s(-1). These results verify the effectiveness of picene-(C14H29)(2) for electronics applications.
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页数:6
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