Multiwavelength interferometry: extended range metrology

被引：51
|
作者：
Falaggis, Konstantinos [1 ]
Towers, David P. [1 ]
Towers, Catherine E. [1 ]
机构：
[1] Univ Leeds, Sch Mech Engn, Leeds LS2 9JT, W Yorkshire, England
来源：
OPTICS LETTERS | 2009年 / 34卷 / 07期
基金：
英国工程与自然科学研究理事会;
关键词：
D O I：
10.1364/OL.34.000950
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
We present an optimized method for multiwavelength interferometry that allows measurements beyond the largest beat wavelength. The approach exploits wavelength coincidence between two beat wavelengths in order to measure unambiguously over an extended range. Performance of the approach has been validated both through simulations and experimentally by means of a fiber interferometer for four measurement wavelengths. Initial results have demonstrated 1/200th of a fringe phase resolution, giving absolute metrology over 18.16 mm, or a dynamic range of 1 part in 2.4 x 10(6). With improved phase resolution the method has the potential to range over > 100 m using femtosecond laser frequency comb sources. (C) 2009 Optical Society of America
引用
收藏
页码：950 / 952
页数：3
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