Atomic force microscopy:: A powerful tool for probing the microbial cell surface.

被引：0
|
作者：
Dufrêne, YF [1 ]
机构：
[1] Univ Catholique Louvain, Unite Chim Interfaces, B-1348 Louvain, Belgium
来源：
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY | 2002年 / 224卷
关键词：
D O I：
暂无
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
008-COLL
引用
收藏
页码：U397 / U397
页数：1
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