Piezoelectric field and confinement effects on the dielectric function spectrum of InGaN/GaN quantum wells

被引:7
|
作者
Ramakrishnan, A
Wagner, J [1 ]
Kunzer, M
Obloh, H
Köhler, K
Johs, B
机构
[1] Fraunhofer Inst Angew Festkorperphys, D-79108 Freiburg, Germany
[2] JA Woollam Co Inc, Lincoln, NE 68508 USA
关键词
D O I
10.1063/1.125662
中图分类号
O59 [应用物理学];
学科分类号
摘要
In0.13Ga0.87N/GaN double heterostructures and quantum wells (QWs) have been studied by room-temperature photoluminescence (PL) and spectroscopic ellipsometry (SE). PL revealed the presence of strong piezoelectric fields, which strongly influence the luminescence properties for InGaN QW widths in the 3-12 nm range. The pseudodielectric function spectrum derived from the SE measurements were analyzed using a multilayer approach, describing the dielectric function of the individual layers by a parametric oscillator model. The fundamental band-gap resonance in the InGaN dielectric-function spectrum was found to broaden for an InGaN layer width of 12 nm, as compared to bulk-like InGaN layers, due to piezoelectric field effects. For a much narrower QW width of 1.7 nm, however, quantum confinement was found to dominate over piezoelectric-field effects, resulting in a much sharper band-gap resonance shifted to higher energies and an increased oscillator strength. (C) 2000 American Institute of Physics. [S0003-6951(00)01001-9].
引用
收藏
页码:79 / 81
页数:3
相关论文
共 50 条
  • [1] Optical transitions in InGaN/GaN quantum wells: effects of the piezoelectric field
    Zhang, XH
    Liu, W
    Chua, SJ
    [J]. JOURNAL OF CRYSTAL GROWTH, 2004, 268 (3-4) : 521 - 526
  • [2] Piezoelectric field effects in InGaN quantum wells
    Brown, IH
    Pope, IA
    Smowton, PM
    Blood, P
    Thomson, JD
    Chow, WW
    [J]. 2003 IEEE LEOS ANNUAL MEETING CONFERENCE PROCEEDINGS, VOLS 1 AND 2, 2003, : 880 - 881
  • [3] Pressure dependence of piezoelectric field in InGaN/GaN quantum wells
    Vaschenko, G
    Patel, D
    Menoni, CS
    Gardner, NF
    Sun, J
    Götz, W
    Tomé, CN
    Clausen, B
    [J]. PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 2001, 228 (01): : 73 - 76
  • [4] Effects of prestrained layers on piezoelectric field and indium incorporation in InGaN/GaN quantum wells
    Song, Jae-Ho
    Kim, Ho-Jong
    An, Byung-Jun
    Song, Jung-Hoon
    Moon, Youngboo
    Yuh, Hnan-Kuk
    Choi, Sung-Chul
    [J]. 2009 CONFERENCE ON LASERS AND ELECTRO-OPTICS AND QUANTUM ELECTRONICS AND LASER SCIENCE CONFERENCE (CLEO/QELS 2009), VOLS 1-5, 2009, : 3157 - +
  • [5] Dominant role of the piezoelectric field in the pressure behavior of InGaN/GaN quantum wells
    Vaschenko, G
    Patel, D
    Menoni, CS
    Keller, S
    Mishra, UK
    DenBaars, SP
    [J]. APPLIED PHYSICS LETTERS, 2001, 78 (05) : 640 - 642
  • [6] Determination of the piezoelectric field in InGaN quantum wells
    Brown, IH
    Pope, IA
    Smowton, PM
    Blood, P
    Thomson, JD
    Chow, WW
    Bour, DP
    Kneissl, M
    [J]. APPLIED PHYSICS LETTERS, 2005, 86 (13) : 1 - 3
  • [7] Piezoelectric field compensation in the InGaN quantum wells of GaN/InGaN/AlGaN LEDs structures: electroreflectance experiment
    Avakyants, Lev
    Bokov, Pavel
    Chervyakov, Anatoly
    Yunovich, Alexander
    Vasileva, Elena
    Yavich, Boris
    [J]. PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 7, NO 7-8, 2010, 7 (7-8):
  • [8] Measurement of piezoelectric field and tunneling times in strongly biased InGaN/GaN quantum wells
    Jho, YD
    Yahng, JS
    Oh, E
    Kim, DS
    [J]. APPLIED PHYSICS LETTERS, 2001, 79 (08) : 1130 - 1132
  • [9] Effects of strain-control layers on piezoelectric field and indium incorporation in InGaN/GaN blue quantum wells
    Song, Jae-Ho
    Dong, Yanqun
    Kim, Ho-Jong
    Ahn, Byung-Jun
    Kim, Tae-Soo
    Hong, Soon-Ku
    Yuh, Hwan-Kuk
    Choi, Sung-Chul
    Moon, Youngboo
    Shee, Sangkee
    Lee, Jae-Hak
    Song, Jung-Hoon
    [J]. PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, 2010, 4 (8-9): : 221 - 223
  • [10] Direct observation of piezoelectric fields in GaN/InGaN/GaN strained quantum wells
    Barnard, JS
    Cherns, D
    [J]. JOURNAL OF ELECTRON MICROSCOPY, 2000, 49 (02): : 281 - 291