Polarization state analysis in optical coherence tomography

被引：0
|
作者：
Stratkowski, Marcin [1 ]
Plucinski, Jerzy [1 ]
Maciejewski, Maciej [1 ]
Kosmowski, Bogdan B. [1 ]
机构：
[1] Gdansk Univ Technol, Narutowicza 11-12, PL-80952 Gdansk, Poland
来源：
PHOTONICS APPLICATIONS IN ASTRONOMY, COMMUNICATIONS, INDUSTRY, AND HIGH-ENERGY PHYSICS EXPERIMENTS 2006, PTS 1 AND 2 | 2006年 / 6347卷
关键词：
optical coherence tomography; polarization; PS-OCT;
D O I：
10.1117/12.714776
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Optical Coherence Tomography (OCT) is a novel optical measurement technique for high resolution, high sensitivity 2D and 3D visualization of material inner structure. With the aid of OCT one can analyze a wide range of biological and technical materials in non-contact and non-destructive way. In our research we concentrate on possibilities of using OCT systems for characterization of polarization properties of investigated materials. We present a short review of polarization sensitive OCT topologies and principle of polarization state measurement.
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页数：6
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