Conoscopic interferometry of wafers for surface-acoustic wave devices

被引：0

作者：

Ayras, P ^{[1
]}

Friberg, AT ^{[1
]}

Kaivola, M ^{[1
]}

Salomaa, MM ^{[1
]}

机构：

[1] TECH UNIV BERLIN,INST OPT,D-10623 BERLIN,GERMANY

来源：

JOURNAL OF APPLIED PHYSICS | 1997年 / 82卷 / 08期

关键词：

D O I：

暂无

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We show that in interpreting the: conoscopic interference fringes, one should exercise care in employing approximate expressions which fail for certain crystal cuts. In this paper, we study 64 degrees- and 128 degrees-rotated Y-cut and Z-cut LiNbO3 wafers. We show that the error made in using the approximate formulae for the sam!les is more than 25% and that one has to use exact formulae in order to attain quantitative agreement with the experimental data. (C) 1997 American Institute of Physics.

引用

页码：4039 / 4042

页数：4

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