X-Ray Photoelectron Spectroscopy - Methodology and Application

被引：0

作者：

Papis-Polakowska, E. ^{[1
]}

White, R. G. ^{[2
]}

Deeks, C. ^{[2
]}

Mannsberger, M. ^{[2
]}

Krajewska, A. ^{[3
]}

Strupinski, W. ^{[3
]}

Plocinski, T. ^{[4
]}

Jankowska, O. ^{[5
]}

机构：

[1] Inst Electr Mat Technol, PL-02668 Warsaw, Poland

[2] Thermo Fisher Sci, Waltham, MA 02454 USA

[3] Inst Elect Mat Technol, PL-01919 Warsaw, Poland

[4] Warsaw Univ Technol, Fac Mat Sci & Engn, PL-02507 Warsaw, Poland

[5] COMEF, PL-40719 Katowice, Poland

来源：

ACTA PHYSICA POLONICA A | 2014年 / 125卷 / 04期

关键词：

GRAPHENE;

D O I：

10.12693/APhysPolA.125.1061

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

The crucial measurements aspects of X-ray photoelectron spectroscopy, such as chemical state analysis, depth profiling, mapping, and thickness calculation have been presented. The metal alloys, Ti2O5, graphene and type-II InAs/GaSb superlattice structures have been examined by using the new Thermo Scientific K-Alpha X-ray Photoelectron Spectrometer.

引用

页码：1061 / 1064

页数：4

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