A XRD Method to Measure Orientation of Single Crystal Superalloys

被引：0

作者：

Zhao Xinbao ^{[1
]}

Liu Lin ^{[1
]}

Yu Zhuhuan ^{[1
]}

Liu Gang ^{[1
]}

Fu Hengzhi ^{[1
]}

机构：

[1] NW Polytech Univ, State Key Lab Solidificat Proc, Xian 710072, Peoples R China

来源：

RARE METAL MATERIALS AND ENGINEERING | 2009年 / 38卷 / 07期

关键词：

X-ray diffraction; deviation angle of orientation; single crystal superalloy;

D O I：

暂无

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A method to determine preferred orientation of Ni-base single crystal superalloys AM3 is presented by use of X-ray diffractometer. By rotating a sample along its surface axis during theta-scanning process to ensure the normal axis of the crystal plane to across the diffraction plane multiply, the relationship between the crystal plan and the surface is obtained. The credibility is discussed by comparing the results of calculation and experiments. The identification of single crystal superalloys and dispersion degree of crystal orientation are elucidated. It is found that this method is simple and accurate for identifying single crystal superalloys.

引用

页码：1280 / 1283

页数：4

共 9 条

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