Simulations of effusion from ISOL target/ion source systems

被引：14
|
作者：
Mustapha, B [1 ]
Nolen, JA [1 ]
机构：
[1] Argonne Natl Lab, Div Phys, Argonne, IL 60439 USA
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2004年 / 521卷 / 01期
关键词：
ISOL targets; release curve; effusion; Monte Carlo simulation;
D O I：
10.1016/j.nima.2003.11.143
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
Monte Carlo simulations of the low- and high-conductivity Target/Ion Source systems used at Oak Ridge National Laboratory for effusion measurements are performed. Comparisons with the corresponding experimental data for the different geometries are presented and discussed. Independent checks of the simulation using data for simple geometries and using the conductance approach well known in vacuum technology are performed. A simulation-based comparison between the low- and high-conductivity systems is also presented. (C) 2003 Elsevier B.V. All rights reserved.
引用
收藏
页码：59 / 64
页数：6
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