Increasing the reliability of microprocessor-based measurement instruments

被引:0
|
作者
Pavlov, AA
机构
关键词
Memory Device; Error Vector; Code Word; Test Word; Hardware Cost;
D O I
10.1007/BF02504392
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We consider construction of error-correcting codes to increase the probability of correction of single errors and detection of a maximum number of uncorrectable errors.
引用
收藏
页码:332 / 337
页数:6
相关论文
共 50 条