X-ray topographic observation of magnetic domain structures induced by stresses

被引：2
|
作者：
Polcarová, M
Brádler, J
Tomás, I
Jacques, A
Georges, A
机构：
[1] Inst Phys AS CR, Prague 18221 8, Czech Republic
[2] Ecole Mines, Phys Mat Lab, F-54042 Nancy, France
来源：
PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES | 1999年 / 357卷 / 1761期
关键词：
X-ray topography; magnetic domains; back reflection;
D O I：
10.1098/rsta.1999.0458
中图分类号：
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号：
07 ; 0710 ; 09 ;
摘要：
Magnetic domain structures were observed by synchrotron radiation back-reflection topography in bicrystals of Fe-4at%Si. Their appearance depends on the type of the bicrystal, on the inspected surface and on the applied stress, Models of the probable domain structures were suggested and topographic contrast explained.
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页码：2689 / 2700
页数：12
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