Dual vibrational high frequency magnetic force microscopy

The ability to evaluate high frequency writer performance is crucial to the write-head designs for high data rate application. To quantify the write-head performance at high frequency (similar to1 GHz), a new high frequency detection approach has been implemented. The essence of the method is to utilize a two-step signal mixing process to produce the force harmonics, which are not only proportional to the amplitude of the deep-gap field but also fall within the active bandwidth of the probe spectrum. Furthermore, a dual-vibration detection scheme is also described, which can provide superior high spatial resolution and enhance the sensitivity of attractive mode force microscopy as well at high frequencies. (C) 2002 American Institute of Physics.