Origins of interlayer formation and misfit dislocation displacement in the vicinity of InAs/GaAs quantum dots

被引:1
|
作者
Huang, S. [1 ]
Kim, S. J. [1 ]
Pan, X. Q. [1 ]
Goldman, R. S. [1 ,2 ]
机构
[1] Univ Michigan, Dept Mat Sci & Engn, Ann Arbor, MI 48109 USA
[2] Univ Michigan, Dept Phys, Ann Arbor, MI 48109 USA
关键词
IN0.6GA0.4AS ISLANDS; GAAS(001); GROWTH; EPITAXY; LAYERS; MODE;
D O I
10.1063/1.4891330
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have examined the origins of interlayer formation and misfit dislocation (MD) displacement in the vicinity of InAs/GaAs quantum dots (QDs). For QDs formed by the Stranski-Krastanov mode, regularly spaced MDs nucleate at the interface between the QD and the GaAs buffer layer. In the droplet epitaxy case, both In island formation and In-induced "nano-drilling" of the GaAs buffer layer are observed during In deposition. Upon annealing under As flux, the In islands are converted to InAs QDs, with an InGaAs interlayer at the QD/buffer interface. Meanwhile, MDs nucleate at the QD/interlayer interface. (C) 2014 AIP Publishing LLC.
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页数:4
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