In-plane texture study of the Yttria-stabilized Zirconia films fabricated by ion-beam-assisted deposition

被引：0
|
作者：
Yuan, J
Yang, GQ
Mao, YJ
Ren, XC
Liu, XH
Zou, SC
机构：
来源：
ION IMPLANTATION TECHNOLOGY - 96 | 1997年
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中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Biaxially-textured Yttria-stabilized Zirconia (YSZ) films for use as buffer layers of YBCO superconducting films have been synthesized on Ni-Cr metallic substrates by using ion-beam-assisted deposition (IBAD). And the growth mechanism of biaxially-textured YSZ films controlled by ion beam has been investigated in this paper.
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页码：729 / 732
页数：4
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