X-ray molecular orbital analysis. I. Quantum mechanical and crystallographic framework

被引:8
|
作者
Tanaka, Kiyoaki [1 ,2 ]
机构
[1] Nagoya Ind Sci Res Inst, Res Div, Chikusa Ku, Yotsuya Tori 1-13, Nagoya, Aichi 4640819, Japan
[2] Nagoya Inst Technol, Grad Sch Engn, Shouwa Ku, Gokiso Cho, Nagoya, Aichi 4668555, Japan
关键词
X-ray molecular orbital analysis (XMO); molecular orbitals; least-squares method; ELECTRON-DENSITY DISTRIBUTION; LEAST-SQUARES METHOD; METHOD INCORPORATING ORTHONORMALITY; ACCURATE DIFFRACTION DATA; CAMERA-IMAGING PLATE; POPULATION ANALYSIS; WAVE-FUNCTIONS; AVALANCHE PHOTODIODES; SCATTERING FACTORS; CRYSTAL-FIELD;
D O I
10.1107/S2053273318005478
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Molecular orbitals were obtained by X-ray molecular orbital analysis (XMO). The initial molecular orbitals (MOs) of the refinement were calculated by the ab initio self-consistent field (SCF) MO method. Well tempered basis functions were selected since they do not produce cusps at the atomic positions on the residual density maps. X-ray structure factors calculated from the MOs were fitted to observed structure factors by the least-squares method, keeping the orthonormal relationship between MOs. However, the MO coefficients correlate severely with each other, since basis functions are composed of similar Gaussian-type orbitals. Therefore, a method of selecting variables which do not correlate severely with each other in the least-squares refinement was devised. MOs were refined together with the other crystallographic parameters, although the refinement with the atomic positional parameters requires a lot of calculation time. The XMO method was applied to diformohydrazide, (NHCHO)(2), without using polarization functions, and the electron-density distributions, including the maxima on the covalent bonds, were represented well. Therefore, from the viewpoint of X-ray diffraction, it is concluded that the MOs averaged by thermal vibrations of the atoms were obtained successfully by XMO analysis. The method of XMO analysis, combined with X-ray atomic orbital (AO) analysis, in principle enables one to obtain MOs or AOs without phase factors from X-ray diffraction experiments on most compounds from organic to rare earth compounds.
引用
收藏
页码:345 / 356
页数:12
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