Three-dimensional measurement of light-emitting diode radiation pattern: a rapid estimation

被引：13
|
作者：
Moreno, Ivan [1 ]
Sun, Ching-Cherng [2 ]
机构：
[1] Univ Autonoma Zacatecas, Unidad Acad Fis, Zacatecas, Mexico
[2] Natl Cent Univ, Dept Opt & Photon, Taipei, Taiwan
来源：
MEASUREMENT SCIENCE AND TECHNOLOGY | 2009年 / 20卷 / 07期
关键词：
angular intensity distribution; light-emitting diode; inspection; CCD camera; image processing; INTENSITY; CALIBRATION; SYSTEMS;
D O I：
10.1088/0957-0233/20/7/075306
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
We describe a simple imaging technique that enables a three-dimensional inspection of the angular intensity distribution of a light-emitting diode (LED) over a significant part of the hemisphere. The measurement set-up is very simple: it consists of only a charge-coupled device (CCD) camera and a flat diffuse translucent screen. An LED illuminates the screen, and the CCD camera records one image from the back. The visualization algorithm takes into account the cosine-fourth law, vignetting and screen transmittance to render the far-field radiation pattern from the recorded image.
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页数：6
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