Total internal reflection microscopy with a multilayered interface: a light scattering model based on a discrete sources method

被引：13
|
作者：
Eremina, Elena
Grishina, Natalia
Eremin, Yuri
Helden, Laurent
Wriedt, Thomas
机构：
[1] Univ Bremen, D-28359 Bremen, Germany
[2] Moscow MV Lomonosov State Univ, Moscow 119992, Russia
[3] Univ Stuttgart, Inst Phys, D-70550 Stuttgart, Germany
[4] Inst Werkstofftech, D-28539 Bremen, Germany
来源：
JOURNAL OF OPTICS A-PURE AND APPLIED OPTICS | 2006年 / 8卷 / 11期
关键词：
total internal reflection microscopy; evanescent waves scattering; layered interface; discrete sources method;
D O I：
10.1088/1464-4258/8/11/011
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
The discrete sources method has been extended to analyse P or S polarized evanescent wave scattering by a dielectric particle located on a layered interface. This was done to develop a light scattering simulation model for total internal reflection microscopy. The influence of metallic layers on the prism surface is investigated. Numerical results for the objective response versus particle height and the scattering cross-section are presented.
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页码：999 / 1006
页数：8
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