Nano-structure analysis of polycrystallization in amorphous silicon on Si(100)

被引:0
|
作者
Fukaya, T [1 ]
Kimura, K [1 ]
Takahashi, K [1 ]
Shibayama, T [1 ]
Takahashi, H [1 ]
机构
[1] Hokkaido Univ, Grad Sch Engn, Sapporo, Hokkaido 0608628, Japan
关键词
polysilicon; ATEM; annealing; nano-structure;
D O I
暂无
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In order to improve the performance of high-speed, ultra-large-scale integrated (ULSI) devices, control of the grain size of polysilicon is needed. Polycrystallization of amorphous silicon has been studied by using thermal annealing following low-pressure chemical vapor deposition (LPCVD) deposited on Si(100) substrate. The polycrystallization process in amorphous silicon strongly depends on annealing temperature and time. In this study, cross-sectional and plane-view observations were carried out using analytical transmission electron microscope (ATEM). Cross-sectional TEM specimens were prepared by the conventional ion milling method and plane-view TEM specimens were prepared by the focused ion beam (FIB) micro-sampling technique. The effects of annealing temperature and time on polycrystallization in amorphous silicon deposited on Si(100) were investigated.
引用
收藏
页码:171 / 174
页数:4
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