An instrument for combining x-ray multiple diffraction and x-ray topographic imaging for examining crystal microcrystallography and perfection

被引：0

作者：

Lai, X. ^{[1
]}

Ma, C. Y. ^{[1
]}

Roberts, K. J. ^{[1
]}

Cardoso, L. P. ^{[1
,2
]}

dos Santos, A. O. ^{[2
]}

Bogg, D. ^{[3
]}

Miller, M. C. ^{[3
]}

机构：

[1] Univ Leeds, Inst Particle Sci & Engn, Sch Proc Environm & Mat Engn, Leeds LS2 9JT, W Yorkshire, England

[2] Univ Estadual Campinas, IFGW, BR-13083970 Campinas, SP, Brazil

[3] STFC Daresbury Lab, Warrington WA4 4AD, Cheshire, England

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2009年 / 80卷 / 03期

基金：

英国工程与自然科学研究理事会;

关键词：

crystal defects; crystal morphology; crystal symmetry; gallium arsenide; III-V semiconductors; potassium compounds; X-ray diffraction; X-ray diffractometers; X-ray topography; POTASSIUM DIHYDROGEN PHOSPHATE; SIMULTANEOUS BRAGG-DIFFRACTION; NONLINEAR-OPTICAL MATERIAL; RENNINGER SCANNING-MODE; SYNCHROTRON-RADIATION; EPITAXIAL LAYERS; PHASE PROBLEM; SIMULTANEOUS REFLECTIONS; HABIT MODIFICATION; SINGLE-CRYSTALS;

D O I：

10.1063/1.3103571

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Diffraction imaging using x-ray topography (XRT) and x-ray multiple diffraction (XRMD) provide valuable tools for examining the growth defects in crystals and the distributions from ideal lattice symmetry (microcrystallography). The topographic x-ray multiple diffraction microprobe (TMDM) combines the complementary aspects of both techniques enabling XRT and XRMD studies within the same instrument providing a useful resource for the structural characterization of materials that are not very stable in vacuum and electron beam environments. The design of the TMDM instrument is described together with data taken on GaAs (001) and potassium dihydrogen phosphate (001).

引用

页数：6

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