X-ray optics for beamlines at diamond light sourcex

被引:1
|
作者
Alcock, S. G.
Alianelli, L.
Sawhney, K. J. S.
机构
关键词
x-ray optics; metrology; synchrotron light;
D O I
10.1117/12.684012
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A dedicated optics and metrology team has been assembled at Diamond Light Source to take responsibility for designing, procuring and testing a wide range of state-of-the-art x-ray optics, providing the Diamond beamlines with effective solutions to condition and focus synchrotron light. Advanced efforts are underway to design and construct a cleanroom laboratory to house a suite of metrology instruments. This will complement the Test beamline, used for a wide range of tasks including x-ray optics and detector developments, and proof of principle experiments. In collaboration with industrial and academic partners, these experimental facilities will be used to measure and develop the next generation of x-ray optics, and help the Diamond beamlines to achieve world leading performance. Details of the planning and early construction phase of the Metrology laboratory are presented, and preliminary examples of x-ray metrology measurements and research programmes.
引用
收藏
页数:9
相关论文
共 50 条
  • [1] X-RAY OPTICS FOR ESRF BEAMLINES - PROBLEMS AND PROJECTS
    FREUND, AK
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1992, 63 (01): : 413 - 418
  • [2] X-RAY OPTICS Diamond brilliance
    Durbin, Stephen M.
    Colella, Roberto
    [J]. NATURE PHYSICS, 2010, 6 (03) : 163 - 164
  • [3] Ronchi test for characterization of X-ray nanofocusing optics and beamlines
    Uhlen, Fredrik
    Rahomaki, Jussi
    Nilsson, Daniel
    Seiboth, Frank
    Sanz, Claude
    Wagner, Ulrich
    Rau, Christoph
    Schroer, Christian G.
    Vogt, Ulrich
    [J]. JOURNAL OF SYNCHROTRON RADIATION, 2014, 21 : 1105 - 1109
  • [4] At-wavelength Metrology of X-ray Optics at Diamond Light Source
    Wang, Hongchang
    Berujon, Sebastien
    Sutter, John
    Alcock, Simon G.
    Sawhney, Kawal
    [J]. ADVANCES IN METROLOGY FOR X-RAY AND EUV OPTICS V, 2014, 9206
  • [5] Production of diamond single crystals for synchrotron X-ray beamlines
    Sellschop, JPF
    [J]. CRYSTAL AND MULTILAYER OPTICS, 1998, 3448 : 40 - 46
  • [6] GRAZING-INCIDENCE OPTICS FOR SYNCHROTRON RADIATION X-RAY BEAMLINES
    HEALD, SM
    HASTINGS, JB
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1981, 187 (2-3): : 553 - 561
  • [7] LIGHT WEIGHT X-RAY OPTICS
    CITTERIO, O
    [J]. PHYSICS AND ASTROPHYSICS IN THE SPACE STATION ERA, 1989, 17 : 211 - 220
  • [8] X-RAY OPTICS RESEARCH-AND-DEVELOPMENT FOR SPRING-8 BEAMLINES
    URUGA, T
    KIMURA, H
    KOHMURA, Y
    KURODA, M
    NAGASAWA, H
    OHTOMO, K
    YAMAOKA, H
    ISHIKAWA, T
    UEKI, T
    IWASAKI, H
    HASHIMOTO, S
    KASHIHARA, Y
    OKUI, K
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1995, 66 (02): : 2254 - 2256
  • [9] State-of-the-art of software tools for modeling x-ray optics and beamlines
    del Río, MS
    [J]. X-RAY MIRRORS, CRYSTALS AND MULTILAYERS, 2001, 4501 : 160 - 168
  • [10] CVD diamond thin film for IR optics and X-ray optics
    Ying, XT
    Xu, XM
    [J]. THIN SOLID FILMS, 2000, 368 (02) : 297 - 299