Integration techniques for surface X-ray diffraction data obtained with a two-dimensional detector

被引：35

作者：

Drnec, Jakub ^{[1
]}

Zhou, Tao ^{[2
]}

Pintea, Stelian ^{[1
,3
]}

Onderwaater, Willem ^{[1
]}

Vlieg, Elias ^{[3
]}

Renaud, Gilles ^{[2
]}

Felici, Roberto ^{[1
]}

机构：

[1] ESRF, Grenoble, France

[2] CEA Grenoble, INAC NRS SP2M, F-38054 Grenoble, France

[3] Radboud Univ Nijmegen, Inst Mol & Mat, NL-6525 ED Nijmegen, Netherlands

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 2014年 / 47卷

关键词：

RECIPROCAL-SPACE;

D O I：

10.1107/S1600576713032342

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

This article proposes two integration methods to determine the structure factors along a surface diffraction rod measured with a two-dimensional detector. The first method applies the classic way of calculating integrated intensities in angular space. This is adapted to work efficiently with two-dimensional data. The second method is based on integration in reciprocal space. An intensity map is created by converting the detected intensity pixel by pixel to the reciprocal space. The integration is then performed directly on this map. A theoretical framework, as well as a comparison between the two integration methods, is provided.

引用

页码：365 / 377

页数：13

共 50 条

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