GaN Power Devices: Challenges for Improved Stability and Reliability

被引：0
|
作者：
Meneghini, Matteo [1 ]
机构：
[1] Univ Padua, Dipartimento Ingn Informaz, Via Gradenigo 6-A, I-35131 Padua, Italy
来源：
2022 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS) | 2022年
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中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
TuT8
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页数：1
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