Energy spread in ion beam analysis

被引:72
|
作者
Szilagyi, E [1 ]
机构
[1] KFKI Res Inst Particle & Nucl Phys, H-1525 Budapest, Hungary
基金
匈牙利科学研究基金会;
关键词
ion beam analysis; energy resolution; multiple scattering; simulation; optimisation;
D O I
10.1016/S0168-583X(99)00671-0
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
In ion beam analysis (IBA) the depth profiles are extracted from the experimentally determined energy profiles. The spectra, however, are subject to finite energy resolution of both extrinsic and intrinsic origin. Calculation of those effects such as instrumental beam, geometry and detection-related energy and angular spreads as well as energy straggling, multiple scattering and Doppler effects in the sample itself is not trivial, especially since it involves treatment of nonindependent random processes. A proper account for energy spread is vital in IBA not only for correct extraction of elemental and isotopic depth profiles from the measured spectra, but already prior to data acquisition, in optimising experimental conditions to reach the required depth resolution at a certain depth. After a short review of the literature on the different energy spread contributions experimental examples are given from resonance, RES, elastic BS and ERDA practice in which an account for energy spread contributions is essential. Some further examples illustrate extraction of structural information (roughness, pore size, etc.) from elaborated depth resolution calculation for such layer structures. (C) 2000 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:37 / 47
页数:11
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