Textured growth of buffer layer structures for YBCO coated conductors

被引：0
|
作者：
Akin, Y [1 ]
Bacaltchuk, CMB [1 ]
Goddard, RE [1 ]
Celik, E [1 ]
Arda, L [1 ]
Garmestani, H [1 ]
Sigmund, W [1 ]
Hascicek, YS [1 ]
机构：
[1] Florida State Univ, Natl High Magnet Field Lab, Tallahassee, FL 32310 USA
来源：
ADVANCES IN CRYOGENIC ENGINEERING, VOLS 50A AND B | 2004年 / 711卷
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中图分类号：
O414.1 [热力学];
学科分类号：
摘要：
Textured growth of Cerium oxide (CeO2) and 100% lattice matched (Eu0.893Yb0.107)(2)O-3 buffer layers were investigated for YBCO coated conductors as cap layers on Gd2O3 thin films by chemical solution deposition technique. CeO2 is one of the most widely used cap layer for fabrication of coated conductors, especially when e-beam evaporation technique is used for Y-BCO processing. (Eu0.893Yb0.107)(2)O-3 was designed as a perfect lattice matched cap layer, and CeO2 and (Eu0.893Yb0.107)(2)O-3 cap layers have been fabricated on biaxially textured Ni substrates by chemical solution deposition technique in our laboratory. This time we presented textured growth of Ce02 on a Gd2O3 thin film and textured growth of (EU0.893Yb0.107)(2)O-3 on the CeO2/Gd2O3/Ni buffer layers structure by chemical solution deposition technique.
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页码：653 / 660
页数：8
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