Analysis about Crafts and Technologies of Low-PIM and PIM Interference Testing System

被引：0
|
作者：
Yang, Baoguo [1 ]
Wang, Zunfeng [1 ]
Li, Mingtai [1 ]
机构：
[1] Sci & Technol Elect Test & Measurement Lab, Qingdao, Peoples R China
来源：
MATERIALS PROCESSING AND MANUFACTURING III, PTS 1-4 | 2013年 / 753-755卷
关键词：
PIM; PIMI testing system; technology analysis; non-ferromagnetic material;
D O I：
10.4028/www.scientific.net/AMR.753-755.2334
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Main low-PIM crafts were summarized, such as Material requirements of major devices and special requirements of electroplating process. The setting up technologies of a PIMI testing system was discussed, for example reducing the number of connectors, isolators being used to prevent active IM and requirements of subsystem and receiver being given. Based on those crafts and technologies, a PINE testing system was setting up with a design goal of 3rd residual PIM being -165dBc@2x43dBm. It achieved the goal with -165dBc through actual measuring after calibration.
引用
收藏
页码：2334 / 2338
页数：5
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