Snapback-free and low-loss SAG-LIGBT with self-driving auxiliary gate

被引:1
|
作者
Chen, Weizhong [1 ,2 ]
Li, Shun [1 ]
Huang, Yao [1 ]
Huang, Yi [1 ]
Han, ZhengSheng [2 ,3 ]
机构
[1] Chongqing Univ Posts & Telecommun, Coll Elect Engn, Chongqing 400065, Peoples R China
[2] Chinese Acad Sci, Inst Microelect, Beijing 100029, Peoples R China
[3] Univ Chinese Acad Sci, Beijing 100049, Peoples R China
关键词
silicon-on-insulator; insulated gate bipolar transistors; electron accumulation layer; low-resistance path; snapback effect; shorted-anode LIGBT; SSA-LIGBT; SA-LIGBT; N-buffer LIGBT; low-loss SAG-LIGBT; low-loss shorted-anode lateral insulated bipolar transistor; metal oxide semiconductor structure; anode electrode; gate signal; P-base serving; anode resistance RSA; snapback-free SAG-LIGBT; self-driving auxiliary gate; silicon on insulator; MOS structure; electron current; vertical P-collector LIGBT; Si; REVERSE-CONDUCTING IGBT; SOI-LIGBT;
D O I
10.1049/iet-pel.2019.1491
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A novel snapback-free and low-loss shorted-anode lateral insulated bipolar transistor (SA-LIGBT) based on silicon on insulator with self-driving auxiliary gate (SAG) in the anode is proposed, named as SAG-LIGBT. The SAG is characterised by metal oxide semiconductor (MOS) structure in the anode, and the gate of the MOS is shorted with the anode electrode, thus self-driving without extra gate signal is achieved. At anode voltage V-A = 0, the P-base serving as a barrier to hinder electrons flowing into the N + anode. At V-A = V-on of the forward conduction, the P-base is depleted to intrinsic, and the anode resistance R-SA is increased from RP-base to R-intrinsic. At V-A = V-bus of the turn-off state, the P-base is fully depleted and an electron accumulation layer is formed under the SiO2, thus the R-SA is decreased from R-intrinsic to Rn-channel to provide a low-resistance path for electron current. Consequently, the device not only eliminates the snapback effect but also reduces the turn-off energy loss E-off. Therefore, a better trade-off is obtained between V-on and E-off. At the same V-on, the E-off of SAG-LIGBT is decreased by 57 and 66% compared with separated shorted-anode LIGBT (SSA-LIGBT) and SA-LIGBT, respectively. Moreover, the SAG-LIGBT exhibits the shorter T-off of 80 ns than the SSA-LIGBT and vertical P-collector and N-buffer LIGBT at J(A) = 100 A/cm(2).
引用
收藏
页码:3314 / 3318
页数:5
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