Modeling of oxidation-induced growth stresses

被引：35
|
作者：
Limarga, AM [1 ]
Wilkinson, DS [1 ]
Weatherly, GC [1 ]
机构：
[1] McMaster Univ, Dept Mat Sci & Engn, Hamilton, ON L8S 4L7, Canada
来源：
SCRIPTA MATERIALIA | 2004年 / 50卷 / 12期
关键词：
oxidation; residual stress; analytical modeling; stress-driven diffusion;
D O I：
10.1016/j.scriptamat.2004.03.001
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
Stress induced by the oxidation process is studied using an analysis based on the stress-driven diffusional flux of oxygen ions along oxide grain boundaries. The calculated stress, which is considered to originate from the constrained lateral expansion of the oxide scale, is in reasonable agreement with measured values. (C) 2004 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
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页码：1475 / 1479
页数：5
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