BALMER ALPHA LINE SHAPE AND SURFACE MORPHOLOGY DURING DEPTH PROFILING ANALYSIS OF THIN FILM

被引：0
|
作者：
Steflekova, V. [1 ]
Jovovic, J. [1 ]
Sisovic, N. M. [1 ]
Konjevic, N. [1 ]
机构：
[1] Univ Belgrade, Fac Phys, Belgrade 11001, Serbia
来源：
24TH SUMMER SCHOOL AND INTERNATIONAL SYMPOSIUM ON THE PHYSICS OF IONIZED GASES, CONTRIBUTED PAPERS | 2008年 / 84期
关键词：
D O I：
暂无
中图分类号：
P1 [天文学];
学科分类号：
0704 ;
摘要：
The results of the H(alpha) line shape analysis during depth profiling of zinc thin layer at steel surface (commercial name of materials: galfan and galvanneal) are presented. Changes of the H(alpha) line shape are detected during depth profiling of thin layer in Grimm discharge. An attempt is made to correlate the H(alpha) line shape changes with surface morphology recorded with Atomic Force Microscope (AFM).
引用
收藏
页码：265 / 268
页数：4
相关论文
共 50 条
  • [1] GDOES depth profiling analysis of a thin surface film on aluminium
    Shimizu, K
    Habazaki, H
    Skeldon, P
    Thompson, GE
    Wood, GC
    [J]. SURFACE AND INTERFACE ANALYSIS, 1999, 27 (11) : 998 - 1002
  • [2] Thin film depth profiling by ion beam analysis
    Jeynes, Chris
    Colaux, Julien L.
    [J]. ANALYST, 2016, 141 (21) : 5944 - 5985
  • [3] Sputter-depth profiling for thin-film analysis
    Hofmann, S
    [J]. PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 2004, 362 (1814): : 55 - 75
  • [4] Ultra thin film sputter depth profiling
    J. F. Moulder
    S. R. Bryan
    U. Roll
    [J]. Fresenius' Journal of Analytical Chemistry, 1999, 365 : 83 - 84
  • [5] Ultra thin film sputter depth profiling
    Moulder, JF
    Bryan, SR
    Roll, U
    [J]. FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY, 1999, 365 (1-3): : 83 - 84
  • [6] Shape of the magnetic resonance line in a thin film on the surface of an anisotropic superconductor
    Efremova, SA
    Tsarevskii, SL
    [J]. PHYSICS OF THE SOLID STATE, 1999, 41 (03) : 347 - 349
  • [7] Shape of the magnetic resonance line in a thin film on the surface of an anisotropic superconductor
    S. A. Efremova
    S. L. Tsarevskii
    [J]. Physics of the Solid State, 1999, 41 : 347 - 349
  • [8] Parameterization of Balmer-alpha asymmetric line shape in tokamak SOL plasmas
    Kukushkin, A. B.
    Neverov, V. S.
    Kadomtsev, M. B.
    Kotov, V.
    Kukushkin, A. S.
    Levashova, M. G.
    Lisgo, S. W.
    Lisitsa, V. S.
    Shurygin, V. A.
    Alekseev, A. G.
    [J]. XXII INTERNATIONAL CONFERENCE ON SPECTRAL LINE SHAPES (ICSLS 2014), 2014, 548
  • [9] ELECTRON-BEAM-INDUCED DIFFUSION DURING THIN-FILM DEPTH PROFILING
    ROLL, K
    LOSCH, W
    ACHETE, C
    [J]. JOURNAL OF APPLIED PHYSICS, 1979, 50 (06) : 4422 - 4424
  • [10] Influence of interfacial depth on depth resolution during GDOES depth profiling analysis of thin alumina films
    Shimizu, K
    Habazaki, H
    Skeldon, P
    Thompson, GE
    Marcus, RK
    [J]. SURFACE AND INTERFACE ANALYSIS, 2001, 31 (09) : 869 - +
12345