Three-dimensional profilometry method with single-frame multifrequency composite projection fringe

被引：1

作者：

Hu, Hailing ^{[1
,2
,3
]}

Chen, Yang ^{[1
,2
,3
]}

Zhang, Peiqing ^{[2
,3
,4
]}

Shen, Xiang ^{[2
,3
,4
,5
]}

Dai, Shixun ^{[2
,3
,4
]}

Song, Baoan ^{[1
,2
,3
]}

机构：

[1] Ningbo Univ, Fac Elect Engn & Comp Sci, Ningbo, Peoples R China

[2] Ningbo Univ, Key Lab Photoelect Detect Mat & Devices Zhejiang P, Ningbo, Peoples R China

[3] Engn Res Ctr Adv Infrared Photoelect Mat & Devices, Ningbo, Peoples R China

[4] Ningbo Univ, Res Inst Adv Technol, Ningbo, Peoples R China

[5] Ningbo Univ, Ningbo Inst Oceanog, Ningbo, Peoples R China

来源：

OPTICAL ENGINEERING | 2022年 / 61卷 / 12期

基金：

中国国家自然科学基金;

关键词：

absolute phase; complex fringe projection; phase error propagation; single-frame; FOURIER-TRANSFORM PROFILOMETRY; AUTOMATIC-MEASUREMENT; PHASE; ALGORITHMS;

D O I：

10.1117/1.OE.61.12.124107

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

An improved composite Fourier transform profilometry is proposed in this study to quickly measure the three-dimensional (3D) contour of an object. Three groups of fringe patterns with different frequencies are combined in this method. Compared with the other composite profilometry, it solves the problem of phase error propagation in phase unwrapping. The absolute phase of the object is accurately calculated and the measuring accuracy is improved greatly by filtering out the background direct current noise. Both simulation and experiment results show that the 3D contour of the measured object can be reconstructed quickly and accurately by this method. It has great application potential in the field of real-time 3D measurement.

引用

页数：10

共 50 条

[1] Refractive fringe projection profilometry for three-dimensional shape measurement
Chen, Chao
Li, Zhaonan
Lu, Wenzhen
Wang, Yuzhu
[J]. OPTICS LETTERS, 2023, 48 (17) : 4689 - 4692
[2] Fringe Projection Profilometry for Three-Dimensional Measurement of Aerospace Blades
Chen, Ze
Zhu, Mulun
Sun, Chuanzhi
Liu, Yongmeng
Tan, Jiubin
[J]. SYMMETRY-BASEL, 2024, 16 (03):
[3] Three-dimensional surface inspection for semiconductor components with fringe projection profilometry
Deng, Fuqin
Ding, Yi
Peng, Kai
Xi, Jiangtao
Yin, Yongkai
Zhu, Ziqi
[J]. OPTICAL METROLOGY AND INSPECTION FOR INDUSTRIAL APPLICATIONS IV, 2016, 10023
[4] Single frame color fringe projection profilometry based on empirical mode decomposition imbalance correction algorithm for fast three-dimensional reconstruction
Zhu, Qian
Zhao, Hong
Zhao, Zixin
[J]. OPTICAL ENGINEERING, 2022, 61 (08)
[5] Three-dimensional shape measurement with an arbitrarily arranged fringe projection profilometry system
Du, Hua
Wang, Zhaoyang
[J]. OPTICS LETTERS, 2007, 32 (16) : 2438 - 2440
[6] Optical edge-projection method for three-dimensional profilometry
Tay, CJ
Miao, H
Fu, Y
[J]. OPTICS LETTERS, 2005, 30 (20) : 2718 - 2720
[7] Real-time three-dimensional infrared imaging using fringe projection profilometry
Jiangsu Key Laboratory of Spectral Imaging and Intelligence Sense, Nanjing University of Science and Technology, Nanjing 210094, China
不详
不详
[J]. Chin. Opt. Lett., 2013, SUPPL.2
[8] Three -dimensional spatial point computation in fringe projection profilometry
Juarez-Salazar, Rigoberto
Rodriguez-Reveles, Gustavo A.
Esquivel-Hernandez, Sofia
Diaz-Ramirez, Victor H.
[J]. OPTICS AND LASERS IN ENGINEERING, 2023, 164
[9] Fringe projection profilometry for the 3D shape measurement of objects with three-dimensional movements
Duan, Chengpu
Zhang, Yiwei
Xi, Jiangtao
Tong, Jun
Yu, Yanguang
Guo, Qinghua
[J]. OPTICAL METROLOGY AND INSPECTION FOR INDUSTRIAL APPLICATIONS VI, 2019, 11189
[10] Simple multifrequency and phase-shifting fringe-projection system based on two-wavelength lateral shearing interferometry for three-dimensional profilometry
Mehta, DS
Dubey, SK
Hossain, MM
Shakher, C
[J]. APPLIED OPTICS, 2005, 44 (35) : 7515 - 7521

← 1 2 3 4 5 →