Assessment of selected CERES electronic component survivability under simulated overvoltage conditions

被引：1
|
作者：
Chapman, JJ [1 ]
Grant, MS [1 ]
Bockman, J [1 ]
Clark, VM [1 ]
Hess, PC [1 ]
机构：
[1] NASA, LaRC, Hampton, VA 23665 USA
来源：
EARTH OBSERVING SYSTEMS IV | 1999年 / 3750卷
关键词：
D O I：
10.1117/12.363546
中图分类号：
V [航空、航天];
学科分类号：
08 ; 0825 ;
摘要：
引用
收藏
页码：494 / 502
页数：9
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