(Ultra)Wide-Bandgap Vertical Power FinFETs

被引:73
|
作者
Zhang, Yuhao [1 ]
Palacios, Tomas [2 ]
机构
[1] Virginia Polytech Inst & State Univ, Ctr Power Elect Syst, Blacksburg, VA 24061 USA
[2] MIT, Microsyst Technol Labs, 77 Massachusetts Ave, Cambridge, MA 02139 USA
关键词
FinFETs; Gallium nitride; Silicon carbide; Logic gates; JFETs; Aluminum nitride; breakdown voltage (BV); capacitances; diamond; FinFET; frequency; gallium nitride (GaN); gallium oxide; JFET; MOSFET; ON-resistance; power electronics; power semiconductor devices; silicon carbide (SiC); static induction transistor (SIT); switching loss; ultrawide bandgap (UWBG); wide bandgap (WBG); SCHOTTKY-BARRIER DIODES; FIELD-EFFECT TRANSISTOR; THRESHOLD-VOLTAGE; R-ON; GAN; MG; ACTIVATION; INSTABILITY; FABRICATION; MECHANISMS;
D O I
10.1109/TED.2020.3002880
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
FinFET is the backbone device technology for CMOS electronics at deeply scaled technology nodes per Moore's law. Recently, the FinFET concept has been leveraged to develop a new generation of vertical power transistors based on wide-bandgap (WBG) and ultrawide-bandgap (UWBG) semiconductors for kilovolts and high-power applications. The sidewall gate-stack in a vertical power FinFET can rely on either a metal-oxide-semiconductor (MOS) structure or a p-n junction, rendering a Fin-MOSFET or a fin-based junction field-effect transistor (Fin-JFET), respectively. Although the device technologies are still at the early stage of development, 1.2-kV-class WBG gallium nitride (GaN) power Fin-MOSFETs have demonstrated one of the highest static and switching performances in all similarly rated power transistors; UWBG gallium oxide power Fin-MOSFETs have shown high performance up to a breakdown voltage over 2.6 kV. Early UWBG diamond lateral power Fin-MOSFETs have also been demonstrated. Meanwhile, GaN power Fin-JFETs are currently under active development. This article provides a comprehensive tutorial and review of the background and recent advances in WBG and UWBG vertical power FinFETs. It covers fundamental device physics, device and process development, as well as the static and switching performance of various power Fin-MOSFETs and Fin-JFETs. This article is concluded by identifying the current challenges and exciting research opportunities in this very dynamic research field.
引用
收藏
页码:3960 / 3971
页数:12
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