Structure modifications in chalcopyrite semiconductors

被引:25
|
作者
Su, DS
Neumann, W
Giersig, M
机构
[1] Humboldt Univ, AG Kristallog, Inst Phys, D-10115 Berlin, Germany
[2] Hahn Meitner Inst Kernforsch Berlin GmbH, D-14109 Berlin, Germany
关键词
structure modification; chalcopyrite; CuAu-ordering; zinc-blende; electron diffraction;
D O I
10.1016/S0040-6090(99)00837-8
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The microstructure of epitaxial CuInS2, CuGaSe2 and polycrystalline CuInS2 films was studied by transmission electron microscopy. We found that the vapour-phase epitaxy of CuInS2 below the transition temperature T-c results in films with chalcopyrite and CuAu-like structures.. The formation of CuAu-like ordered phases within the films is independent of the substrate orientation, whereas the amount of CuAu-like ordered Cu and In atoms can be influenced by the substrate orientation. Thr co-existence of chalcopyrite and CuAu-like ordering of the metal atoms was also found in polycrystalline CuInS2 films prepared by sulphurization of Cu/In metal precursor at a temperature below T-c. In contrast, vapour-phase epitaxy of CuGaSe2 below T-c provides only films with the chalcopyrite structure. The experimental finding is in good agreement with the results of first-principle band-structure calculations. (C) 2000 Elsevier Science S.A. All rights reserved.
引用
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页码:218 / 222
页数:5
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