Probability of error analysis of analog-to-digital converters with multiple 8-PSK modulated sinals

被引:1
|
作者
Kumar, R. [1 ]
Taggart, D. [1 ]
Chen, C. [1 ]
机构
[1] Aerosp Corp, El Segundo, CA 90245 USA
关键词
D O I
10.1109/AERO.2005.1559465
中图分类号
V [航空、航天];
学科分类号
08 ; 0825 ;
摘要
In modern satellite systems the uplink RF wideband signal after downconversion to IF is input to the analog-to-digital converter (ADC), the output of which is digitally processed for the purpose of channelization and switching of signals. In such systems, a major implementation limitation is the ADC, which needs to operate at a rate at least two times the received signal bandwidth. In the case of a wideband signal composed of many multiplexed signals, the spectral distribution of quantization noise is also of significant interest. Another very important consideration in the ADC performance analysis is the signal clipping effect that occurs whenever the instantaneous input signal amplitude exceeds the maximum linear range of the quantizer. Since clipping cannot be avoided in most practical situations, the signal power to the quantization-plus-clipping-noise-power ratio is of utmost interest. Such a ratio is in general a function of the quantizer load factor that in turn is the ratio of the input signal average power to the maximum peak power at the quantizer output. Even more important for digital communication is the probability of symbol error obtained in the presence of quantization and clipping noise in addition to the receiver thermal noise. The paper presents simulation results on the quantizer analysis when the input signal is composed of a specified number of 8-PSK modulated signals, which have been band limited by square root raised cosine filters. The results are obtained in terms of the probability of symbol error as a Junction of quantizer load factor.
引用
收藏
页码:1705 / 1712
页数:8
相关论文
共 50 条
  • [1] Analysis of bit error probability of trellis coded 8-PSK
    Yoshikawa, H
    [J]. IEICE TRANSACTIONS ON FUNDAMENTALS OF ELECTRONICS COMMUNICATIONS AND COMPUTER SCIENCES, 2005, E88A (10): : 2956 - 2959
  • [2] Exact analysis of bit error probability for trellis coded 8-PSK
    Yoshikawa, H
    [J]. 5TH INTERNATIONAL SYMPOSIUM ON WIRELESS PERSONAL MULTIMEDIA COMMUNICATIONS, VOLS 1-3, PROCEEDINGS, 2002, : 1257 - 1261
  • [3] Performance analysis of analog-to-digital converters for wideband digitally modulated signals
    Kumar, R
    Taggart, D
    Goo, G
    [J]. 2004 IEEE AEROSPACE CONFERENCE PROCEEDINGS, VOLS 1-6, 2004, : 1375 - 1382
  • [4] STATISTICAL ANALYSIS OF THE WORD ERROR RATE MEASUREMENT IN ANALOG-TO-DIGITAL CONVERTERS
    Catelani, Marcantonio
    Zanobini, Andrea
    Ciani, Lorenzo
    [J]. XIX IMEKO WORLD CONGRESS: FUNDAMENTAL AND APPLIED METROLOGY, PROCEEDINGS, 2009, : 694 - 697
  • [5] Adaptive Error Compensation for Photonic Analog-to-Digital Converters
    Khilo, Anatol
    Birge, Jonathan R.
    Kaertner, Franz X.
    [J]. 2008 CONFERENCE ON LASERS AND ELECTRO-OPTICS & QUANTUM ELECTRONICS AND LASER SCIENCE CONFERENCE, VOLS 1-9, 2008, : 544 - +
  • [6] ERROR SOURCES AND PERFORMANCE TESTS FOR AUDIO ANALOG-TO-DIGITAL AND DIGITAL-TO-ANALOG CONVERTERS
    VANDEPLASSCHE, R
    [J]. JOURNAL OF THE AUDIO ENGINEERING SOCIETY, 1985, 33 (7-8): : 584 - 584
  • [7] DEVICE FOR AUTOMATED MEASUREMENT OF THE DYNAMIC ERROR OF ANALOG-TO-DIGITAL CONVERTERS
    AMINEV, AM
    TIMOFEEV, AL
    [J]. INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 1983, 26 (03) : 585 - 587
  • [8] HIGH-RESOLUTION ERROR PLOTTER FOR ANALOG-TO-DIGITAL CONVERTERS
    CORCORAN, JJ
    HORNAK, T
    SKOV, PB
    [J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1975, 24 (04) : 370 - 374
  • [9] DEVICE FOR AUTOMATED MEASUREMENT OF THE DYNAMIC ERROR OF ANALOG-TO-DIGITAL CONVERTERS.
    Aminev, A.M.
    Timofeev, A.L.
    [J]. Instruments and experimental techniques New York, 1983, 26 (3 pt 1): : 585 - 587
  • [10] Numerical analysis of superconductive oversampling analog-to-digital converters
    Fujimaki, A
    Nakazono, K
    Onogi, M
    Okada, K
    Sekiya, A
    Hayakawa, H
    [J]. IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 2003, 13 (02) : 492 - 495